Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

by Joseph I. Goldstein, Dale E. Newbury (Editor), David C. Joy (Editor)

A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, I

Genres: Physics

720 pages, Paperback

First published November 30, 1981

Reviews

[Loukie Adlem · Rating 5 out of 5]

Only the best book to have on hand in the SEM lab.

[Petr Polovodov · Rating 5 out of 5]

Good reference for SEM scientists and engineers.

[Marissa · Rating 1 out of 5]

honestly the most difficult exam i have done and WOULD NOT RECOMMEND unless it is necessary for your degree 😘